publications

2026

1. MLCAD

   From Tool Invocation to Source-Mechanism Exploration: Protected White-Box DSE for Open-Source EDA

   Zhiyu Zheng , Yiming Du , Ziyi Wang, and 1 more author

   In Proceedings of the 8th ACM/IEEE International Symposium on Machine Learning for CAD, 2026

   arXiv Bib HTML PDF

   @inproceedings{zheng2026reviewdse,
     title = {From Tool Invocation to Source-Mechanism Exploration: Protected White-Box DSE for Open-Source EDA},
     author = {Zheng, Zhiyu and Du, Yiming and Wang, Ziyi and Wang, Zhiang},
     booktitle = {Proceedings of the 8th ACM/IEEE International Symposium on Machine Learning for CAD},
     year = {2026},
     url = {https://arxiv.org/abs/2607.11294},
   }

2. ISPD

   Invited: Toward Sustainable and Transparent Benchmarking for Academic Physical Design Research

   Liwen Jiang , Andrew Kahng , Zhiang Wang, and 1 more author

   In Proceedings of the 2026 International Symposium on Physical Design, 2026

   DOI Bib HTML

   @inproceedings{jiang2026benchmarking,
     title = {Invited: Toward Sustainable and Transparent Benchmarking for Academic Physical Design Research},
     author = {Jiang, Liwen and Kahng, Andrew and Wang, Zhiang and Zheng, Zhiyu},
     booktitle = {Proceedings of the 2026 International Symposium on Physical Design},
     year = {2026},
     doi = {10.1145/3764386.3779611},
     url = {https://dl.acm.org/doi/10.1145/3764386.3779611},
   }

3. DATE

   CHIP-MAP: A Collaborative Optimization Framework for Macro Placement Using Large Language Models

   Yiming Du , Renye Yan , Yunfan Yang, and 7 more authors

   In Proceedings of the 2026 Design, Automation & Test in Europe Conference, 2026

   DOI Bib HTML

   @inproceedings{du2026chipmap,
     title = {{CHIP-MAP}: A Collaborative Optimization Framework for Macro Placement Using Large Language Models},
     author = {Du, Yiming and Yan, Renye and Yang, Yunfan and Qu, Frank and Tan, Jiajun and Zheng, Zhiyu and Gan, Yiming and Liang, Ling and Wang, Zongwei and Cai, Yimao},
     booktitle = {Proceedings of the 2026 Design, Automation & Test in Europe Conference},
     year = {2026},
     doi = {10.23919/date69613.2026.11539734},
     url = {https://ieeexplore.ieee.org/document/11539734},
   }